Patent · US Expired

Method of manufacturing a metallic silicide transparent electrode

US5151385A · kind A · utility

53Cited by
8References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 1988
Grant dateSep 29, 1992
Priority date
Expiry dateOct 3, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/147
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device such as a solar cell, photodiode and solid state imaging device comprises a semiconductor layer made of amorphous silicon formed on a given substrate, and a transparent conductive layer formed by an interfacial reaction between the amorphous silicon and a metallic film directly formed on the amorphous silicon. This transparent conductive layer is used as a transparent electrode of the device and if necessary the remainder after having partially removed the metallic film for the transparent conductive layer is used as a conductive layer and light shielding film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.