Patent · US Expired

FET with gate spacer

US5153145A · kind A · utility

46Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 1989
Grant dateOct 6, 1992
Priority date
Expiry dateOct 17, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/021

Abstract

A semiconductor integrated circuit structure and method of fabrication is disclosed. The structure includes a FET gate with adajcent double or triple-layered gate spacers. The spacers permit precise tailoring of lightly doped drain junction profiles having deep and shallow junction portions. In addition, a self-aligned silicide may be formed solely over the deep junction portion thus producing a reliable low contact resistance connection to source and drain.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.