Adapter and test fixture for an integrated circuit device package
US5166609A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 1990 |
| Grant date | Nov 24, 1992 |
| Priority date | — |
| Expiry date | May 24, 2010 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S439/912
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.