Patent · US Expired

Positive photoresist composition with naphthoquinonediazidesulfonate of oligomeric phenol

US5178986A · kind A · utility

32Cited by
3References
48Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 1992
Grant dateJan 12, 1993
Priority date
Expiry dateJun 19, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/022
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A radiation sensitive oligomeric compound is described as the photoactive component with a base soluble phenolic matrix resin to provide improved photo-resist composition having high light-sensitivity, high resolution, excellent developer resistance and excellent resistance to thermal flow.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.