Patent · US Expired

Wafer scale of full wafer memory system, packaging method thereof, and wafer processing method employed therein

US5191224A · kind A · utility

13Cited by
14References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 1990
Grant dateMar 2, 1993
Priority date
Expiry dateDec 13, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

To achieve higher packaging density and one wafer level for a full-sized wafer memory, or wafer-scale integration memory system, the wafers are vertically stacked with each other at a predetermined interval. A packaging technique is improved in such a way that a memory system layout can be precisely realized and a precise through hole can be formed. Moreover, other chips are fixed on the wafer so as to achieve furthermore the high packaging density.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.