Optical submicron aerosol particle detector
US5192870A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 1992 |
| Grant date | Mar 9, 1993 |
| Priority date | — |
| Expiry date | Jan 14, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle detector that determines the presence of particles in an enclosed volume includes a laser that directs a coherent optical beam to a beam splitter that produces first and second divergent beams. An optical system images the point of origin of the two divergent beams within the beam splitter into the enclosed volume, whereby the first and second beams are caused to intersect and interfere at an inspection region within the volume. A detector is positioned adjacent the volume and is responsive to light scattered from one of the beams, as a result of a particle passing through the inspection region, to produce an electrical signal indicative of the intensity of the scattered light. A signal processor analyzes the electrical signals and to determine the presence of the particle. An embodiment of the invention includes an acousto-optic modulator to enable one of the beams to be frequency shifted from the other beam so as to enable the presence of a carrier signal on which a particle's Doppler frequency is modulated. Another embodiment relies upon the Doppler modulation of a reflected optical beam to create an interference pattern at a detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.