Inventor · Somers, NY, US

John S. Batchelder

22Patents
18h-index
21Co-inventors
77Inventor score

Filing activity: Apr 17, 1986 → Sep 3, 1997

Most-cited inventions

PatentTitleAreaCited byStatus
US5303141A Model generation system having closed-loop extrusion nozzle positioning Emerging Cross-Sectional Technologies 361 Expired
US5402351A Model generation system having closed-loop extrusion nozzle positioning Emerging Cross-Sectional Technologies 163 Expired
US5220403A Apparatus and a method for high numerical aperture microscopic examination of materials Physics 156 Expired
US5312224A Conical logarithmic spiral viscosity pump Emerging Cross-Sectional Technologies 142 Expired
US5177559A Dark field imaging defect inspection system for repetitive pattern integrated circuits Physics 127 Expired
US5208648A Apparatus and a method for high numerical aperture microscopic examination of materials Physics 102 Expired
US4740708A Semiconductor wafer surface inspection apparatus and method Physics 72 Expired
US5860472A Fluid transmissive apparatus for heat transfer Mechanical Engineering; Lighting; Heating 63 Expired
US5037202A Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field Physics 49 Expired
US5192870A Optical submicron aerosol particle detector Physics 48 Expired
US5823249A Manifold for controlling interdigitated counterstreaming fluid flows Electricity 44 Expired
US4969198A System for automatic inspection of periodic patterns Physics 42 Expired
US5133602A Particle path determination system Physics 36 Expired
US5116583A Suppression of particle generation in a modified clean room corona air ionizer Electricity 30 Expired
US5061070A Particulate inspection of fluids using interferometric light measurements Physics 21 Expired
US5884691A Fluid transmissive moderated flow resistance heat transfer unit Electricity 21 Expired
US4771468A System for automatic inspection of periodic patterns Physics 20 Expired
US5343290A Surface particle detection using heterodyne interferometer Physics 19 Expired
US5316970A Generation of ionized air for semiconductor chips Emerging Cross-Sectional Technologies 14 Expired
US5294806A Optical submicron aerosol particle detector Physics 10 Expired
US5158690A Thermophoretic filtering of liquids Physics 9 Expired
US5432670A Generation of ionized air for semiconductor chips Emerging Cross-Sectional Technologies 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.