Segmented charge limiting test algorithm for electrical components
US5192913A · kind A · utility
7Cited by
7References
35Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 16, 1992 |
| Grant date | Mar 9, 1993 |
| Priority date | — |
| Expiry date | Mar 16, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/52
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of electrically testing an electrical component containing a plurality of networks with at least one node. The method uses segmented, charge limiting testing to charge the nodes and detect shorted or disconnected nodes while preventing accumulated charges in the networks from making uncharged nodes appear charged. The method is well suited for voltage contrast electron beam testing of unpopulated high density multichip modules and interconnect substrates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.