Raman analysis apparatus
US5194912A · kind A · utility
75Cited by
8References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 6, 1990 |
| Grant date | Mar 16, 1993 |
| Priority date | — |
| Expiry date | Aug 6, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/1226
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample (14) is illuminated by light from a laser source (16), which is reflected to it by a dichroic filter (18) and passed through a microscope objective (20). The microscope objective (20) focusses a two dimensional image of the illuminated area onto a detector (22). On the way to the detector (22), the light passes through an interference filter (26), which selects a desired line from the Raman spectrum scattered by the sample (14). The filter (26) can be tuned to any desired Raman line by rotating it through various angles of incidence (.THETA.), about an axis (28) perpendicular to the optical axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.