Patent · US Expired

Method for forming a grown bipolar electrode contact using a sidewall seed

US5213989A · kind A · utility

43Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 1992
Grant dateMay 25, 1993
Priority date
Expiry dateJun 24, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a grown bipolar transistor electrode contact wherein a substrate (12) is provided. A doped region (31) is formed within the substrate (12). A dielectric layer (26) is formed having an opening (36) which exposes a portion of the doped region (31). Conductive spacers (38) are formed adjacent a sidewall of the dielectric layer (26). A conductive region (34) is formed through either a selective process or an epitaxial process by using the conductive spacers (38) as a source for epitaxial or selective formation. The conductive region (34) forms the grown bipolar electrode contact by electrically contacting the doped region (31). The conductive region (34) is optionally overgrown in a lateral direction over a top surface of the dielectric layer (26) to form a self-aligned electrical contact pad for the doped region (31).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.