Patent · US Expired

Method for producing a layered capacitor structure for a dynamic random access memory device

US5223448A · kind A · utility

51Cited by
6References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 18, 1991
Grant dateJun 29, 1993
Priority date
Expiry dateJul 18, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/68

Abstract

An improved method and resulting structures for producing a layered capacitor structure of memory cell of a DRAM device wherein a doped polysilicon spacer operates as a dopant source for an overlying polysilicon layer on the vertical and sharply inclined surfaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.