Emissivity independent temperature measurement systems

US5226732A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• James S. Nakos · Saint Johnsbury Center, US
• Paul E. Bakeman, Jr. · South Burlington, US
• Dale P. Hallock · Middlebury, US
• Jerome B. Lasky · South Burlington, US
• Scott L. Pennington · South Burlington, US

Key dates

• Filing date: Apr 17, 1992
• Grant date: Jul 13, 1993
• Expiry date: Apr 17, 2012

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J5/802
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An improved contactless temperature measurement system is provided which includes a workpiece, a chamber containing the workpiece with the walls thereof being substantially transmissive to radiation at wavelengths other than a given wavelength and substantially reflective at the given wavelength to remove the dependence of the apparent or measured temperature on the workpiece emissivity variations or fluctuations.