Patent · US Expired

Method and apparatus for evaluating luminous efficiency

US5227638A · kind A · utility

1Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 24, 1991
Grant dateJul 13, 1993
Priority date
Expiry dateJul 24, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/6489
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Photoluminescence or electroluminescence from a material substrate is measured in a photon-counting range. Luminous efficiency of the substrate in its normal operation range is evaluated on the basis of the measured data. The luminescence is measured in an excitation range of the material including a transition excitation level corresponding to a transition luminous level from a low luminous range to a regular, intense luminous range. Two-dimensional distribution of the luminous efficiencies can be obtained by measuring the luminescence from small divided areas of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.