Eiji Inuzuka
6Patents
4h-index
14Co-inventors
50Inventor score
Filing activity: Oct 16, 1981 → Feb 29, 1996
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6002792A | Semiconductor device inspection system | Physics | 17 | Expired |
| US5136373A | Image processing apparatus | Physics | 17 | Expired |
| US5532607A | Semiconductor device inspection system involving superimposition of image data for detecting flaws in the semiconductor device | Electricity | 17 | Expired |
| US4602282A | Measuring devices for two-dimensional photon-caused or corpuscular-ray-caused image signals | Physics | 10 | Expired |
| US4492879A | Trigger circuit | Electricity | 2 | Expired |
| US5227638A | Method and apparatus for evaluating luminous efficiency | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.