Patent · US Expired

Contact assembly for automatic test handler

US5227717A · kind A · utility

74Cited by
11References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateDec 3, 1991
Grant dateJul 13, 1993
Priority date
Expiry dateDec 3, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A contact assembly for use in testing electronic devices such as integrated circuits (IC's) and the like. The contact assembly has a test fixture having a test contactor, a corresponding carrier module aligned on a test tray for positioning the electronic devices to be tested in alignment with the test fixture, and a vertical drive for driving the carrier module to meet with the test contactor. The vertical drive is provided with an individual drive for giving an additional contact force to said carrier module and said test contactor. The vertical drive further includes a lead pusher for ensuring ideal contact pressure for the leads of the electric devices with the test contactor. The carrier module is provided with a plurality of slits for separating the leads of the electric devices and inviting the test contactor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.