ADVANTEST CORPORATION
2,263Patents
1,163Active
2,263Granted
56Portfolio score
Filing activity: May 15, 1985 → Nov 2, 2023 · 591 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6208161A | Differential signal transmission circuit | Electricity | 244 | Expired |
| US6678645B1 | Method and apparatus for SoC design validation | Physics | 164 | Expired |
| US5113139A | Low-distortion waveform generating method and waveform generator using the same | Physics | 153 | Expired |
| US6174744A | Method of producing micro contact structure and contact probe using same | Electricity | 142 | Expired |
| US5172049A | IC test equipment | Physics | 138 | Expired |
| US4602220A | Variable frequency synthesizer with reduced phase noise | Electricity | 134 | Expired |
| US6250933A | Contact structure and production method thereof | Electricity | 117 | Expired |
| US6661839B1 | Method and device for compressing and expanding data pattern | Electricity | 116 | Expired |
| US5761216A | Bit error measurement system | Physics | 108 | Expired |
| US5440260A | Variable delay circuit | Electricity | 106 | Expired |
| US5313156A | Apparatus for automatic handling | Physics | 100 | Expired |
| US6249893A | Method and structure for testing embedded cores based system-on-a-chip | Physics | 100 | Expired |
| US6031282A | High performance integrated circuit chip package | Electricity | 99 | Expired |
| US7020360B2 | Wavelength dispersion probing system | Physics | 97 | Expired |
| US5767690A | Test head cooling system | Physics | 95 | Expired |
| US6052284A | Printed circuit board with electronic devices mounted thereon | Electricity | 88 | Expired |
| US5644248A | Test head cooling system | Physics | 87 | Expired |
| US6218203A | Method of producing a contact structure | Electricity | 86 | Expired |
| US6191596A | Method for detecting a contact position between an object to be measured and measuring pins | Physics | 84 | Expired |
| US6487700B1 | Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it | Physics | 78 | Expired |
| US6464511B1 | IC socket and IC tester | Electricity | 78 | Expired |
| US6795496B1 | Jitter measuring device and method | Physics | 77 | Expired |
| US5290134A | Pick and place for automatic test handler | Electricity | 76 | Expired |
| US6066822A | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | Physics | 74 | Expired |
| US5227717A | Contact assembly for automatic test handler | Physics | 74 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.