Infrared microscopic spectrometer using the attenuated total reflection method
US5229611A · kind A · utility
4Cited by
6References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 17, 1992 |
| Grant date | Jul 20, 1993 |
| Priority date | — |
| Expiry date | Jan 17, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An infrared microscope spectrometer is used to carry out attenuated total reflection (ATR) analysis of a sample. Either the collecting element assembly or focusing element assembly is mounted for selected movement with respect to the other so as to permit alignment of the output beam from the focusing assembly with the optical axis of the spectrometer, whenever an ATR crystal with sample is placed between the collecting and focusing assemblies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.