Juichiro Ukon
20Patents
7h-index
23Co-inventors
69Inventor score
Filing activity: Oct 24, 1990 → Apr 20, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5886347A | Analytical method for multi-component aqueous solutions and apparatus for the same | Physics | 50 | Expired |
| US5278413A | Infrared microscopic spectrometer | Physics | 15 | Expired |
| US5428443A | Laser diffraction-type particle size distribution measuring method and apparatus | Physics | 14 | Expired |
| US5710627A | Wavelength-scanning mechanism and method for spectrometer | Physics | 12 | Expired |
| US5159405A | Multibeam interferometer for use in a Fourier transform spectrometer and a driving device for moving the mirrors used therein | Physics | 10 | Expired |
| US6627155B1 | Combustion furnace system for analyzing elements in a sample | Physics | 8 | Expired |
| US5136422A | Reflective optical system for a microscopic spectrometer | Physics | 7 | Expired |
| US5521845A | Analytical system for remote transmission of data | Physics | 7 | Expired |
| US8704174B2 | Refined oil degradation level measuring instrument and refined oil degradation level measuring method | Physics | 6 | Active |
| US5241362A | Microscopic spectrometer with auxiliary imaging system | Physics | 5 | Expired |
| US5229611A | Infrared microscopic spectrometer using the attenuated total reflection method | Physics | 4 | Expired |
| US5870193A | Apparatus for determining kinds of adsorbates | Physics | 3 | Expired |
| US5745369A | Method and apparatus for determining a peak position of a spectrum | Physics | 3 | Expired |
| US5301007A | Microscopic spectrometer | Physics | 3 | Expired |
| US10918284B2 | Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method | Physics | 1 | Active |
| US10660523B2 | Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method | Physics | 1 | Active |
| US6943879B2 | Method for monitoring and/or controlling the status of a plasma in a plasma spectrometer and spectrometer for implementing such a method | Electricity | 1 | Expired |
| US10753843B2 | Method and apparatus for measuring gel particle | Physics | 0 | Active |
| US10359366B2 | Substrate for surface enhanced Raman scattering spectroscopy and devices using same | Physics | 0 | Active |
| US9116116B2 | Optical analyzer and wavelength stabilized laser device for analyzer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.