Patent · US Expired

Polyamide containing the hexafluoroisopropylidene group and process of using to form a positive image

US5240819A · kind A · utility

10Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 1991
Grant dateAug 31, 1993
Priority date
Expiry dateMar 11, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/31736
  • WIPO fieldMacromolecular chemistry, polymers
  • WIPO sectorChemistry

Abstract

This invention is that of high temperature polyamides containing the hexafluoroisopropylidene group. The high temperature polyamides of the invention and photo or radiation sensitizers provide improved high temperature positive resists which can be developed in aqueous alkaline developer and thermally anneal to form heat resistant, polyoxazole relief structures suitable for use in microelectronic and printing applications. The positive photoresists of the invention have improved solubility in coating solvents and improved photospeed. The polyamides of the invention can be prepared by conventional condensation reactions; e.g. the condensation of a diamine and diacid chloride. In addition the polyamides of this invention provide high temperature protective coatings with superior adhesion properties in applications other than the photoresist area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.