Microscopic spectrometer with auxiliary imaging system
US5241362A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 26, 1991 |
| Grant date | Aug 31, 1993 |
| Priority date | — |
| Expiry date | Dec 26, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/0229
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microscopic spectrometer is disclosed wherein a sample can be irradiated with light from a first light source and either transmitted or reflected through the sample to a spectrometrical measuring system. A half mirror can be detachably provided in the optical system to form two branched optical paths. A second light source can be positioned to irradiate the sample 2 with light through a masking system. The half mirror can transmit the image of the masking system to superimpose it upon the sample and a composite image can then be reflected from the half mirror onto a branched optical path to be observed by the operator. The operator can adjust the actual positions of the masks assembly, while, at the same time, see the entire field of view of the specimen to therefore define in an easy and convenient manner the portion of the specimen to be tested. The respective half mirror and second light source can then be removed prior to performing a spectrometric measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.