Patent · US Expired

Integrated delay line

US5245231A · kind A · utility

65Cited by
6References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 1991
Grant dateSep 14, 1993
Priority date
Expiry dateDec 30, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K2005/00104
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A delay line within an integrated circuit and calibrated by an external time period (calibration clock). The speed of devices in the integrated circuit is assessed using the calibration clock, and this speed then controls how many delay cells within the delay line an input must traverse to trigger the delayed output.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.