Patent · US Expired

Reliability qualification vehicle for application specific integrated circuits

US5251228A · kind A · utility

1Cited by
10References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 5, 1989
Grant dateOct 5, 1993
Priority date
Expiry dateDec 5, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318516
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Reliability qualification vehicles are described with internally generated clock and control signals which may be selected in place of externally generated signals for exercising the vehicle. If implemented in gate-arrays, the vehicle may be contained in different sized packages to test the effects of different size packaging on the vehicle. Substantially all the gates of the vehicle are testable. The vehicle may be operated synchronously and its design enables quick feedback and analysis of faulty portions of a cell library or place and route scheme.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.