Patent · US Expired

Tester calibration verification device

US5256964A · kind A · utility

15Cited by
8References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 1992
Grant dateOct 26, 1993
Priority date
Expiry dateJul 31, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R35/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit for verifying the accuracy a tester, for enhancing its calibration and for providing tracking between testers. The circuit includes a delay element, first and second multiplexers connected to the input and output of the delay element, respectively, and a feedback path linking outputs of the second multiplexer to inputs of the first multiplexer to provide an oscillation. The delay between an input of the first multiplexer to an output of the second multiplexer is measured and this delay is compared to the frequency domain measurement of the same to provide an indication of the accuracy of the tester.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.