Patent · US Expired

Memory cell reading circuit

US5258959A · kind A · utility

19Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 1991
Grant dateNov 2, 1993
Priority date
Expiry dateDec 19, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/28
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory cell reading circuit has a reference cell bit line and a matrix cell bit line connected to a supply voltage through respective loads and are furthermore connected by normally-off equalization transistors which are enabled by a first clock signal. The bit lines are further connected by normally-off resistive equalization transistors whose resistance is significant in conducting conditions. The equalization transistors are enabled by a first clock signal and the resistive equalization transistors are enabled by a second clock signal which has a duration that extends longer than the first clock signal. The memory cell reading circuit decreases the "read" time required for a memory cell, such as an EPROM cell, as compared to reading circuits previously used.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.