Patent · US Expired

Method of making a self aligned static induction transistor

US5260227A · kind A · utility

14Cited by
8References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 24, 1992
Grant dateNov 9, 1993
Priority date
Expiry dateNov 24, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/012

Abstract

A method of fabricating self aligned static induction transistors. The method comprises fabricating an N silicon on N.sup.- silicon substrate having an active area. A guard ring is formed around the active area. An N.sup.+ polysilicon layer is formed that comprises source and gate regions. An oxide layer is formed on the N.sup.+ polysilicon layer. A second polysilicon layer is formed on the oxide layer. A second oxide layer is formed on the second polysilicon layer which is then masked by a self aligning mask. Trenches are etched into the substrate using the self aligning mask and gate regions are formed at the bottom of the trenches. A first layer of metal (gate metal) is deposited to make contact with the gate regions. A layer of photoresist is deposited and planarized, and the first layer of metal is overetched below the top surface of the trench. Plasma nitride is deposited and planarized, and a polysilicon mask is deposited over the planarized layer of plasma nitride. The polysilicon mask is etched to expose the gate metal disposed on the field. A second layer of metal is deposited to make contact with the source and gate regions. A passivation layer is formed, and interconnec…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.