Patent · US Expired

Bidirectional boundary-scan circuit

US5260948A · kind A · utility

24Cited by
15References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 1993
Grant dateNov 9, 1993
Priority date
Expiry dateMar 11, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318536
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A boundary-scan circuit for a bidirectional pin of an integrated circuit which uses fewer standard cells if a cell design is considered, or fewer devices if non-standard cell integrated circuits are considered. In either case, the present invention provides the same functionality as provided in of the bidirectional boundary-scan circuits shown in TEEE 1149.1 in a circuit that should be more compact for the same logic family and integration technology.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.