Dual side access test fixture
US5270641A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 22, 1992 |
| Grant date | Dec 14, 1993 |
| Priority date | — |
| Expiry date | Jan 22, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual side access test fixture tests circuits on both sides of a printed circuit board. The fixture includes a housing, a lower probe plate in the housing, an array of lower test probes in the lower probe plate for contacting the bottom of the board, an upper probe plate on the housing for moving to a closed position above the board, and an array of upper test probes in the upper probe plate for contacting an upper surface of the board when the upper probe plate closed. A plurality of system interface pins in the housing are electrically connected to the lower test probes. An external upper interface connector mounted over the closed upper probe plate has a plurality of contacts for connection to corresponding upper test probes. Flex cables contained within the upper interface connector conduct test signals from the upper test probes directly to an external electronic circuit tester. A first set of test signals is communicated from the lower test probes through the interface pins to the circuit tester. Separately, a second set of test signals is communicated from the upper test probes through contacts in the upper interface connector to the flex cables and to the circuit tester, v…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.