Patent · US Expired

Method for polishing semiconductor wafer edges

US5274959A · kind A · utility

12Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 1992
Grant dateJan 4, 1994
Priority date
Expiry dateDec 11, 2012

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B9/065
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A system and method for polishing the edges of a plurality of semiconductor wafers rotates a stack of wafers against a polish one or more pads such that both the wafer edges and the sides of the edges are polished to a mirror finish. The polish pad has a series of grooves through which the wafer edges are passed to polish the sides of the wafer edges, or two pads are used, one with grooves and one without grooves.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.