Patent · US Expired

Method for forming grain boundary junction devices using high T.sub.c superconductors

US5278140A · kind A · utility

9Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 1992
Grant dateJan 11, 1994
Priority date
Expiry dateSep 16, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S505/728

Abstract

A method is disclosed for fabricating grain boundary junction devices, which comprises preparing a crystalline substrate containing at least one grain boundary therein, epitaxially depositing a high Tc superconducting layer on the substrate, patterning the superconducting layer to leave at least two superconducting regions on either side of the grain boundary and making electrical contacts to the superconducting regions so that bias currents can be produced across the grain boundary.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.