Patent · US Expired

Temperature-dependent DRAM refresh circuit

US5278796A · kind A · utility

205Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 1991
Grant dateJan 11, 1994
Priority date
Expiry dateApr 12, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/406
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A temperature sensing circuit allows a DRAM array to use less power than would normally be possible due to the reduced refresh rate based on the temperature of the DRAM array. The temperature circuit removes the refresh guardbanding on the DRAMS. Instead of refreshing a 1 megabyte DRAM every 8 ms, refreshing the DRAMs every 128 ms is possible, depending on the temperature of the DRAM array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.