Error correcting method for measuring object surface using three-dimension measuring apparatus
US5283630A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 4, 1992 |
| Grant date | Feb 1, 1994 |
| Priority date | — |
| Expiry date | Feb 4, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/255
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimension measuring apparatus having a probe, such as non-contact optical probe, is used to measure the surface of an object, such as an aspherical lens. Initially, the apparatus is used to obtain reference probe measured values of a reference spherical surface having a concave surface and a convex surface. The thus obtained reference probe measure values are compared with data denoting an ideal spherical surface to determine measurement errors corresponding to inclinations of the surface of an object to be measured. Then, the apparatus is used to measure the object to obtain respective probe measured values. The previously determined measurement errors are subtracted from the measured values of corresponding inclinations, thereby compensating for the measurement errors during measurement of the object surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.