Keiichi Yoshizumi
49Patents
12h-index
71Co-inventors
84Inventor score
Filing activity: Jul 12, 1982 → Jun 10, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5444012A | Method for manufacturing semiconductor integrated circuit device having a fuse element | Emerging Cross-Sectional Technologies | 57 | Expired |
| US5144150A | Configuration measuring apparatus | Emerging Cross-Sectional Technologies | 24 | Expired |
| US4507766A | Optical device for optically recording and reproducing information signals on an information carrier | Physics | 23 | Expired |
| US5917181A | Profile measuring apparatus | Physics | 23 | Expired |
| US6480286B1 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Physics | 22 | Expired |
| US5616916A | Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force | Emerging Cross-Sectional Technologies | 19 | Expired |
| US5508540A | Semiconductor integrated circuit device and process of manufacturing the same | Emerging Cross-Sectional Technologies | 19 | Expired |
| US4822139A | Optical head apparatus for optical disc player | Physics | 16 | Expired |
| US5610856A | Semiconductor integrated circuit device | Emerging Cross-Sectional Technologies | 15 | Expired |
| US5283630A | Error correcting method for measuring object surface using three-dimension measuring apparatus | Physics | 12 | Expired |
| US5780328A | Process for producing semiconductor integrated circuit | Electricity | 12 | Expired |
| US8006402B2 | Shape measuring apparatus and shape measuring method | Physics | 12 | Active |
| US6239457A | Semiconductor memory device and manufacturing method thereof | Electricity | 11 | Expired |
| US5880497A | Semiconductor integrated circuit device having capacitance element and process of manufacturing the same | Emerging Cross-Sectional Technologies | 11 | Expired |
| US4776699A | Optical measuring device | Physics | 10 | Expired |
| US5455677A | Optical probe | Physics | 10 | Expired |
| US4611916A | Optical measuring apparatus | Physics | 10 | Expired |
| US5328864A | Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions | Emerging Cross-Sectional Technologies | 9 | Expired |
| US7391083B2 | Semiconductor device and a method of manufacturing the same | Electricity | 9 | Active |
| US7259054B2 | Method of manufacturing a semiconductor device that includes a process for forming a high breakdown voltage field effect transistor | Electricity | 9 | Expired |
| US5319194A | Apparatus for measuring birefringence without employing rotating mechanism | Physics | 9 | Expired |
| US6026583A | Shape measuring apparatus and method | Physics | 8 | Expired |
| US7065893B2 | Measurement probe and using method for the same | Physics | 8 | Expired |
| US6579754B2 | Semiconductor memory device having ferroelectric film and manufacturing method thereof | Electricity | 7 | Expired |
| US7029224B2 | Method and apparatus for transferring a thin plate | Emerging Cross-Sectional Technologies | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.