Patent · US Expired

Method of manufacturing interconnect bumps

US5283948A · kind A · utility

4Cited by
11References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 31, 1991
Grant dateFeb 8, 1994
Priority date
Expiry dateMay 31, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49165
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing interconnect bumps on electrical connectors is disclosed. The interconnect bumps are formed with mechanically interlocking structure which allows the bumps to reach a height substantially greater than prior art bumps, while remaining structurally intact. The interconnect bumps are formed using standard photolithography techniques to form the bumps in multiple interlocking portions to achieve a structurally superior interconnect bump.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.