Patent · US Expired

Manufacturing method including photoresist processing using a near-field optical probe

US5288998A · kind A · utility

29Cited by
8References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 6, 1993
Grant dateFeb 22, 1994
Priority date
Expiry dateJan 6, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/862
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

An optical system useful, e.g., for near-field scanning optical microscopy is provided. The system incorporates a probe having improved properties. In one embodiment, the probe comprises a tapered and partially metallized portion of a single-mode optical fiber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.