Robert Eric Betzig
40Patents
18h-index
12Co-inventors
78Inventor score
Filing activity: Jan 10, 1991 → Dec 16, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5105305A | Near-field scanning optical microscope using a fluorescent probe | Physics | 246 | Expired |
| US7609391B2 | Optical lattice microscopy | Physics | 130 | Active |
| US7710563B2 | Optical microscopy with phototransformable optical labels | Physics | 100 | Active |
| US5254854A | Scanning microscope comprising force-sensing means and position-sensitive photodetector | Emerging Cross-Sectional Technologies | 97 | Expired |
| US5272330A | Near field scanning optical microscope having a tapered waveguide | Emerging Cross-Sectional Technologies | 94 | Expired |
| US5389779A | Method and apparatus for near-field, scanning, optical microscopy by reflective, optical feedback | Physics | 68 | Expired |
| US7626695B2 | Optical microscopy with phototransformable optical labels | Physics | 56 | Active |
| US5288996A | Near-field optical microscopic examination of genetic material | Emerging Cross-Sectional Technologies | 52 | Expired |
| US5286971A | Data recording using a near field optical probe | Emerging Cross-Sectional Technologies | 40 | Expired |
| US7535012B2 | Optical microscopy with phototransformable optical labels | Physics | 32 | Active |
| US7626703B2 | Optical microscopy with phototransformable optical labels | Physics | 31 | Active |
| US5286970A | Near field optical microscopic examination of a biological specimen | Emerging Cross-Sectional Technologies | 31 | Expired |
| US7782457B2 | Optical microscopy with phototransformable optical labels | Physics | 30 | Active |
| US5288998A | Manufacturing method including photoresist processing using a near-field optical probe | Emerging Cross-Sectional Technologies | 29 | Expired |
| US5288997A | Manufacturing method, including near-field optical microscopic examination of a magnetic bit pattern | Physics | 28 | Expired |
| US7626694B2 | Optical microscopy with phototransformable optical labels | Physics | 24 | Active |
| US5288999A | Manufacturing method including near-field optical microscopic examination of a semiconductor wafer | Physics | 19 | Expired |
| US10247672B2 | Non-linear structured illumination microscopy | Physics | 18 | Active |
| US7864314B2 | Optical microscopy with phototransformable optical labels | Physics | 17 | Active |
| US8711211B2 | Bessel beam plane illumination microscope | Physics | 16 | Active |
| US8599376B2 | Optical microscopy with phototransformable optical labels | Physics | 15 | Active |
| US9223125B2 | Bessel beam plane illumination microscope | Physics | 11 | Active |
| US9500846B2 | Rapid adaptive optical microscopy over large multicellular volumes | Physics | 10 | Active |
| US7990611B2 | Optical lattice microscopy using periodic interference patterns of coherent waves | Physics | 10 | Active |
| US8462336B2 | Optical microscopy with phototransformable optical labels | Physics | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.