Optical submicron aerosol particle detector
US5294806A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 1993 |
| Grant date | Mar 15, 1994 |
| Priority date | — |
| Expiry date | Feb 12, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle detector that determines the presence of particles in an enclosed volume includes a laser that directs an optical beam to a beam splitter that produces first and second beams. An optical system directs the first beam into the enclosed volume. A detector is positioned adjacent the volume in order to receive back scattered optical energy arising from a particle in the volume encountering the first beam. The back scattered optical energy and the second beam are optically combined so as to overlap in a region and in the overlap region the back scattered optical energy and second beam are in the same state of focus, of the same polarization and are substantially parallel. A detector located at the overlap region produces an electrical signal indicative of the intensity of the back scattered light. A signal processor analyzes the electrical signal to determine the presence of the particle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.