Patent · US Expired

Nonvolatile semiconductor memory device and data erasing method thereof

US5297096A · kind A · utility

105Cited by
7References
55Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1991
Grant dateMar 22, 1994
Priority date
Expiry dateJun 7, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A flash EEPROM including a memory cell array divided into first and second blocks. Erase pulse applying circuits for applying erase pulses to memory cells and erase verifying circuits for erase-verifying the memory cells are provided one for each of those two blocks. The erase pulse applying circuit and the erase verifying circuit provided corresponding to the first block operate separately from the erase pulse applying circuit and the erase verifying circuit provided corresponding to the second block. The erase pulse applying circuits are each controlled by their corresponding erase verifying circuits. That is, each erase verifying circuit enables its corresponding erase pulse applying circuit only when detecting a memory cell in which a data erase is incomplete in the corresponding block.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.