Patent · US Expired

Method of manufacturing semiconductor device terminal having a gold bump electrode

US5298459A · kind A · utility

30Cited by
3References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 1991
Grant dateMar 29, 1994
Priority date
Expiry dateMar 5, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/131
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device provided with an external connection terminal composed of a metal bump electrode. A first metal film is formed on the entire surface of the semiconductor device, a second metal film on the first metal film, and a third metal film on the second metal film. A resist film is selectively formed on the third metal film. A metal bump electrode is formed on the third metal film, at a portion at which the resist film is not present by electrolytic plating while using the third metal film as a conductive plating electrode and the resist film as a mask. The resist film is removed and the metal films are etched while using the metal bump electrode as a mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.