Patent · US Expired

Method for identifying a semiconductor die using an IC with programmable links

US5301143A · kind A · utility

126Cited by
9References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 1992
Grant dateApr 5, 1994
Priority date
Expiry dateDec 31, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for identifying a semiconductor die includes a programmable integrated circuit formed on the semiconductor die. The programmable circuit includes FET transistors connected to output nodes and to programmable links such as fuses, anti-fuses or laser programmable links which are connected to ground. A gate element of each transistor is connected to an address line which controls current flow through the transistors to the output nodes. During manufacture, the programmable links can be selectively activated to create an identification code which can be read at the output nodes of the integrated circuit upon input of a predetermined address code.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.