Patent · US Expired

Fabrication of electronic devices by electroless plating of copper onto a metal silicide

US5308796A · kind A · utility

62Cited by
4References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 27, 1993
Grant dateMay 3, 1994
Priority date
Expiry dateApr 27, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76879
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

It has been found that selective metallization in integrated circuits is expeditiously achieved through a copper plating procedure. In this process, palladium silicide is used as a catalytic surface and an electroless plating bath is employed to introduce copper plating only in regions where the silicide is present. Use of this procedure yields superior filling of vias and windows with excellent conductivity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.