Patent · US Expired

Wafer scale or full wafer memory system, packaging method thereof, and wafer processing method employed therein

US5309011A · kind A · utility

17Cited by
3References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 1992
Grant dateMay 3, 1994
Priority date
Expiry dateOct 14, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

To achieve higher packaging density and one wafer level for a full-sized wafer memory, or wafer-scale integration memory system, the wafers are vertically stacked with each other at a predetermined interval. A packaging technique is improved in such a way that a memory system layout can be precisely realized and a precise through hole can be formed. Moreover, other chips are fixed on the wafer so as to achieve furthermore the high packaging density.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.