Thermal target test board
US5319213A · kind A · utility
6Cited by
1References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 1992 |
| Grant date | Jun 7, 1994 |
| Priority date | — |
| Expiry date | Apr 6, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S3/7803
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A thermal test target with a uniform surface temperature which can be used to characterize and measure thermal image degradation due to atmospheric propagation of the image radiation field. This thermal test target board produces very uniform spatial frequency patterns with near perfect transitions between hot and cold portions which do not change during the diurnal cycle and which are not impacted by environmental changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.