Patent · US Expired

Bonding apparatus and testing apparatus of a bonded portion

US5323952A · kind A · utility

25Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 1992
Grant dateJun 28, 1994
Priority date
Expiry dateSep 18, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/30105
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A bonding apparatus comprising a bonding tool, means for driving the bonding tool, means for detecting an amount of crushing of a bonding portion during bonding, means for calculating a rate of change of the amount of crushing detected by the amount-of-crushing detecting means, means for setting a target value, which is inputted from an external source, of the amount of crushing of the bonding portion, and means for controlling the driving means. When the rate of change of the amount of crushing calculated by the calculating means is smaller than a predetermined value, the controlling means compares the amount of crushing detected by the amount-of-crushing detecting means with the target value. When the amount of crushing detected by the amount-of-crushing detecting means is smaller than the target value, the controlling means discriminates that the bonding is being performed in a satisfactory manner and hence should be continued.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.