Patent · US Expired

Multilayer magnetic structure wherein the magnitude of the structure magnetoresistance is a function of nonmagnetic layer thickness

US5341118A · kind A · utility

49Cited by
11References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 6, 1993
Grant dateAug 23, 1994
Priority date
Expiry dateMay 6, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B2005/3996
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A multilayer magnetoresistive (MR) sensor formed on a substrate includes alternating layers of a ferromagnetic material and a non-magnetic metallic material. The ferromagnetic material and the non-magnetic material form bilayers which exhibit the property that the magnetoresistance of the multilayered structure oscillates as a function of thickness of the non-magnetic material. A current flow is produced through the MR sensor, and the variations in the resistivity of the MR sensor are sensed as a function of the magnetic field being sensed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.