Semiconductor integrated circuit device having circuit inspection function
US5351211A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 1993 |
| Grant date | Sep 27, 1994 |
| Priority date | — |
| Expiry date | Jul 23, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C7/22
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit including latch circuits disposed on the input and output sides of an object circuit the delay time of which is to be measured, respectively, and a variable delay circuit capable of arbitrarily delaying a timing signal supplied from outside or a timing signal generated inside the integrated circuit by an instruction from outside. The timing signal and a delay signal obtained by delaying the input signal by the variable delay circuit are supplied as clock signals to the latch circuits, and the signal passing through the variable delay circuit is fed back to the input side so as to constitute an oscillation circuit, the oscillation signal of which can be outputted to outside. A signal delayed by a desired time can be automatically generated inside the semiconductor integrated circuit on the basis of this timing signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.