Electron beam exposure apparatus employing blanking aperture array
US5359202A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 1993 |
| Grant date | Oct 25, 1994 |
| Priority date | — |
| Expiry date | Jul 23, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/31774
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
An electron beam exposure apparatus is provided with an electron gun emitting an electron beam, a blanking aperture array including a plurality of two-dimensionally arranged blanking apertures for selectively deflecting the electron beam passing through the blanking apertures in a predetermined direction so as to shape the electron beam into a plurality of electron beams, a deflection device for regularly deflecting the electron beams passed through the blanking aperture array, and an electron beam controller for controlling the electron beams passed through the blanking aperture array so as to irradiate and expose an object surface. The electron gun has a needle shaped chip which comprises a pair of sloping surfaces which are <100> faces, and a vertex portion connecting the sloping surfaces and forming an inverted V-shape at a tip end of the needle shaped chip when viewed in a direction in which the vertex portion extends.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.