Patent · US Expired

Alignment and exposure apparatus and method for manufacture of integrated circuits

US5365342A · kind A · utility

21Cited by
2References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 1993
Grant dateNov 15, 1994
Priority date
Expiry dateMar 10, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An alignment apparatus includes a first off-axis alignment optical system having a magnification, and a second off-axis alignment optical system having a magnification higher than that of the first off-axis alignment optical system, wherein the apparatus is operable in a global alignment mode using the second off-axis alignment optical system. In another aspect, an alignment apparatus which includes a first off-axis alignment optical system having a magnification, a second off-axis alignment optical system having a magnification higher than that of the first off-axis alignment optical system, and a TTL alignment optical system, wherein the alignment apparatus is operable in a global alignment mode using the second off-axis alignment optical system and is operable in another global alignment mode using the TTL optical alignment system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.