Patent · US Expired

Method of making and sealing a semiconductor device having an air path therethrough

US5369057A · kind A · utility

13Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 1993
Grant dateNov 29, 1994
Priority date
Expiry dateDec 21, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49103
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention generally relates to the provision of a vent path during the bonding of silicon wafers and the subsequent encapsulation of the individual devices. A double-sided polished silicon wafer is used for the device wafer. The device wafer includes circuitry, thin membranes and metal interconnections. When bonding a bottom wafer to the device wafer, a vented path exists between the wafers. The venting path includes serpentine shape channel formed by interdigitated fingers and cavities. The cavity and the interdigitated patterns can be etched either together or separately into either wafer. A top wafer has a cavity formed therein. When the top device and bottom wafers are bonded together, the venting path is sealed by dipping the device in a sealing liquid. The serpentine path prevents the sealing liquid from reaching the cavity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.