Patent · US Expired

Fermi threshold field effect transistor with reduced gate and diffusion capacitance

US5369295A · kind A · utility

27Cited by
21References
54Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 18, 1992
Grant dateNov 29, 1994
Priority date
Expiry dateNov 18, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/90
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An improved Fermi FET structure with low gate and diffusion capacity allows conduction carriers to flow within the channel at a predetermined depth in the substrate below the gate, without requiring an inversion layer to be created at the surface of the semiconductor. The low capacity Fermi FET is preferably implemented using a Fermi Tub having a predetermined depth, and with a conductivity type opposite the substrate conductivity type and the same conductivity type as the drain and source diffusions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.