Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing
US5371462A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 1993 |
| Grant date | Dec 6, 1994 |
| Priority date | — |
| Expiry date | Mar 19, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are methods for processing and interpreting data acquired from an eddy current probe array inspection system, based on a background subtraction technique. Test and reference waveform data sets are acquired, and subsequently combined. However, the data sets are first normalized and registered to the same position, registering on characteristic signals produced when scanning over edges. Specific techniques are disclosed for normalizing, correcting for spatial offsets, determining the actual locations of edge signals by peak detection and correlation, and adjusting for variations in the number of points in the test and reference data sets.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.